Surface Processing and Measuring Equipment(Surface polishing/cleaning/inspection/alignment)

Surface polishing equipment

  • Super-hard material polishing, metal polishing
  • Polishing of curved and complex surfaces
  • High precision optical lens polishing
  • Local optimization of optical crystal polishing materials
  • Diamond surface trimming
  • Atomic precision machining of materials
  • Ultra-smooth polishing

Surface Processing Equipment

FSBST

  • ItemParameter
    Wafer size≤8inch
    Load modelCassette
    Wafer alignmentAligner
    Removal efficiency800Å*cm2/s @Si
    Supporting process gasAr/SF6/O2/He or other gas mixtures
    Beam intensity>100µA@Ar
    Beam sizeFWHM<5mm
    Cluster ion energy20/60keV

GCIB

  • ItemParameter
    Wafer size≤8inch
    Load modelManual/custom tool
    Removal efficiency70Å*cm2/s @SiO2
    Supporting process gasAr/SF6/O2/He Or some other mixture of gases
    Beam intensity>100µA @Ar
    Beam sizeFWHM<10mm
    Cluster ion energy20/60keV

Surface Cleaning equipment

SWC6P

  • ItemParameter
    Wafer size150mm/200mm
    Wafer thickness0.35-1.4mm
    ApplicableSi, Si02,LT, LN,Sapphire,SiC,etc
    Clean partDouble side
    Transmission systemFull auto
    Clean method1)Ultrapure water
    2) Ammonia liquor
    3) Amino acid Clean method
    4) atomizing
    5) PVA
    6) Ozone water
    UPH>12pcs
    Load methodCassette full auto
    Particle AFTClean≤10EA(@≥0.3µm)
    surface metal AFT Clean≤5e10 atoms/cm2

Measuring equipment

WPS

  • ItemParameter
    Alignment accuracy±0.2µm
    Wafer size4inch~12inch
    Load modelManual
    Pressure range1-300N
    Pressure accuracy≤±0.3% F.S.
    Optical schemeVisible/infrared

IR-BVI

  • ItemParameter
    Wafer size≤12inch
    Detection accuracy150µm @12inch
    Infrared wavelength0.75~5µm
    Load modelManual
    Equipment layout450mm*450mm*1100mm
    Equipment weight35kg
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